Shannon Seminar Room (a105) Place du Levant 3, Maxwell Building, 1st floor -- Thursday, 30 November 2017 at 11:15 (45 min.)
{
"name":"Computational Imaging in Atomic Force Microscopy",
"description":"Atomic force microscopy (AFM) is an imaging technique which can measure the surface structure of a specimen of interest down to nano-scale. It does this by scanning a tiny probe across the surface and thereby measuring a “height map” or other properties of the surface.",
"startDate":"2017-11-30",
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"startTime":"11:15",
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"location":"Shannon Seminar Room (a105) Place du Levant 3, Maxwell Building, 1st floor",
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Atomic force microscopy (AFM) is an imaging technique which can measure the surface structure of a specimen of interest down to nano-scale. It does this by scanning a tiny probe across the surface and thereby measuring a “height map” or other properties of the surface.
